Inspection of Ultra-low Clearance BGAs on Large Boards is now possible with Inspectis BGA-XL

The Inspectis BGA-XL Stand combined with the new XM Optical Lenses allow you to reach lower and further, whilst providing up to 285x on-screen magnification.

The unique XM lens developed for the Inspectis BGA inspection systems provide a solution for devices with small stand-offs (e.g., 200 microns) and with very small ball arrays. It’s 27% smaller footprint allows the probe to be placed in tight areas, even on high density populated boards.

Inspectis side-view BGA Inspection systems features the smallest and yet the most robust optical 90-degree viewing angle probes available, with built-in high power lighting and a crisp, sharp high-resolution image which allows the user to see further under the BGA. The board platform and precision mechanism provides a stable base with safe control that reduces the risk of prism damage.

The Inspectis BGA Inspection systems are available in two system levels, Basics and ProX which includes powerful Inspectis BGA Inspection, analysis, and documentation software.